• DocumentCode
    3555898
  • Title

    Capability of GaAs DCFL for high-speed gate array

  • Author

    Toyoda, N. ; Terada, T. ; Mochizuki, M. ; Kanazawa, K. ; Mizoguchi, T. ; Hojo, A.

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    28
  • fYear
    1982
  • fDate
    1982
  • Firstpage
    602
  • Lastpage
    605
  • Abstract
    Gallium-arsenide DCFL gate array (4.29 × 4.46 mm2) with 500 3-INPUT NOR gates was fabricated by Pt buried-gate planar process. The delay time was 160 ps under unloaded condition at power dissipation of 0.50 mW/gate for 1.7- \\\\mu m gate device. The delay time increased linearly with fan-out, interconnection line length and cross-over number at rates of 70 ps/fan-out, 100 ps/ mm and 4.5 ps/cross-over, respectively. Circuit simulation based on the experimental results projects that the gate delay time of 150 - 200 ps under actual loading condtition can be achieved in GaAs DCFL gate array LSI using 0.5- \\\\mu m gate FETs.
  • Keywords
    Circuit testing; Delay effects; FETs; Gallium arsenide; Insulation life; Integrated circuit interconnections; Power dissipation; Power supplies; Propagation delay; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1982 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1982.190364
  • Filename
    1482898