DocumentCode :
3555991
Title :
High electron mobility transistors for LSI circuits
Author :
Mimura, T. ; Nishiuchi, K. ; Abe, M. ; Shibatomi, A. ; Kobayashi, M.
Author_Institution :
Fujitsu Limited, Atsugi, Japan
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
99
Lastpage :
102
Abstract :
Current work on HEMT (High Electron Mobility Transistor) LSI technology is presented. Controllability in device parameters of the HEMT is crucially important, and is discussed in the context of LSI capability. Simple device modeling of HEMTs, taking into account the velocity saturation effects, is carried out to provide reasonably accurate predictions of device performance. Master-slave flip-flop divide-by-two circuits which work at the maximum clock frequency of 8.9 GHz with 2.8 mW/gate power dissipation are described.
Keywords :
Circuits; Clocks; Controllability; Flip-flops; Frequency conversion; HEMTs; Large scale integration; MODFETs; Master-slave; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190450
Filename :
1483575
Link To Document :
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