• DocumentCode
    3556025
  • Title

    An optimized 0.5 micron LDD transistors

  • Author

    Rathnam, S. ; Bahramian, H. ; Laurent, D. ; Han, Yu-Pin

  • Author_Institution
    Mostek Corporation, Carrollton, Texas
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    A 0.5 micron triple diffused (LD3) NMOS transistor with a maximum operating voltage of 10 volts has been designed and fabricated. The transistor is a low doped drain type (1,3,6) with an additional boron region (halo) around the source/drain junctions. By properly tailoring this boron profile, long channel behavior can be maintained down to the sub-micron level.
  • Keywords
    Boron; Capacitance; Circuit synthesis; DRAM chips; Doping; Implants; MOSFETs; Resists; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190485
  • Filename
    1483610