• DocumentCode
    3556030
  • Title

    HISETS: A software system for designing semiconductor device packages

  • Author

    Yasukawa, Akio ; Sakamoto, Tatsuji ; Shida, Shigeru

  • Author_Institution
    Hitachi Ltd., Tsuchiura, Japan
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    259
  • Lastpage
    262
  • Abstract
    HISETS (Hitachi Semiconductor Thermal Strength Design System), a software system for designing semiconductor device packages was developed. Five programs are linked together to form a unified analysis of six important package design characteristics; (1) Thermal resistance, (2) Thermal deformation, (3) Thermal stress, (4) Heat resistance of chips and substrates, (5) Life of bonding layer, and (6) Change in electrical characteristics due to stress. An appropriate structure can be quickly obtained by simulating the revision of a structure until calculated results satisfy desired specifications.
  • Keywords
    Electric resistance; Resistance heating; Semiconductor device packaging; Semiconductor devices; Software design; Software packages; Software systems; Substrates; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190490
  • Filename
    1483615