DocumentCode
3556112
Title
A new mask ROM cell programmed by through-hole using double polysilicon technology
Author
Masuoka, Fujio ; Ariizumi, Shoji ; Iwase, Taira ; Maeda, Kumiko ; Ono, Michihiro ; Endo, Norio
Author_Institution
Toshiba Corp., Kawasaki, Japan
Volume
29
fYear
1983
fDate
1983
Firstpage
577
Lastpage
580
Abstract
A new through-hole programmed MASK ROM cell which is suitable for 1Mbit high speed MASK ROM with short turn around time in programming processes, and small cell size is descrived. The memory cell is implemented by NOR gate type which is most suitable for high speed MASK ROM. The new memory cell is successfully applied to 1Mbit MASK ROM with double polysilicon P-well C-MOS technology. A new structure and a new fabrication processes of the device element are also described.
Keywords
Aluminum; Electrodes; Fabrication; Implants; Integrated circuit technology; Joining processes; Passivation; Process design; Read only memory; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190572
Filename
1483697
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