Title :
Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devices
Author :
Valdmanis, J.A. ; Mourou, G.A. ; Gabel, C.W.
Author_Institution :
University of Rochester, Rochester, New York
Abstract :
The electrooptic effect has been used in conjunction with 100 fs optical pulses to sample electrical transients with an unprecedented resolution of .5 ps and sensitivity of 50-100 µV. The electrooptic material can be used in a traveling wave geometry or in an electrodeless manner. Applications of this technique to the characterization of electrical devices and to the study of short pulse propagation are described.
Keywords :
Frequency; High-speed electronics; Lithium compounds; Optical pulse generation; Optical pulses; Optical sensors; Signal processing; Ultrafast optics; Velocity measurement; Voltage;
Conference_Titel :
Electron Devices Meeting, 1983 International
DOI :
10.1109/IEDM.1983.190577
