• DocumentCode
    3556132
  • Title

    Computer simulation in VLSI process modeling

  • Author

    Penumalli, B.R.

  • Author_Institution
    AT&T Bell Laboratories
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    654
  • Lastpage
    657
  • Abstract
    As the fabrication steps in VLSI technology become more complicated and inevitably more expensive, the modeling of these steps and the resulting device performance with the aid of a computer has emerged as a convenient solution. With the trend in the present day VLSI processing toward higher doping levels, many ion implantations, lower processing temperatures and local oxidations for isolation, process simulation programs should be flexible to incorporate evolving physical models easily. Also the programs should be capable of simulating nonplanar device structures and other two- dimensional effects. This paper will review some recent developments in process modeling and related computer simulation activities with a special emphasis on tile physical models and the implementation of these models in the BICEPS program developed at AT & T Bell laboratories.
  • Keywords
    Computational modeling; Computer simulation; Doping; Fabrication; Ion implantation; Oxidation; Semiconductor process modeling; Temperature; Tiles; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190592
  • Filename
    1483717