• DocumentCode
    3556135
  • Title

    Schottky barrier diodes with self-aligned floating guard rings

  • Author

    Chuang, C.T. ; Arienzo, M. ; Tang, D.D. ; Isaac, R.

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, NY
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    666
  • Lastpage
    669
  • Abstract
    Schottky barrier diodes with self-aligned guard rings are described. Two device structures compatible with the self-aligned bipolar transistor process [1] are considered. For the first structure, the diffused guard ring is in physical contact with the anode of the Schottky diode as in conventional guard ring structures. For the second structure, the guard ring is separated from the anode by a sidewall oxide of thickness less than 0.3 µm, allowing independent access to the guard ring. Near-ideal I-V characteristics are obtained for both structures. It is shown that for the latter structure the guard ring can be left floating without degrading the I-V and leakage characteristics of the Schottky diode. In this mode of operation, the advantage of the guard ring is maintained while the depletion capacitance and charge storage due to injection from the p+-n junction which reduce the effectiveness of the Schottky diode as an antisaturation device are eliminated.
  • Keywords
    Anodes; Bipolar transistors; Capacitance; Circuits; Degradation; Electrodes; Large scale integration; Leakage current; Schottky barriers; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190595
  • Filename
    1483720