• DocumentCode
    3556146
  • Title

    Electrical characterization of LPE n-p Hg0.8Cd0.2Te/CdTe heterojunctions

  • Author

    LoVecchio, P. ; Raghunath, T.R. ; Grimbergen, M.N. ; Rawe, R.L. ; Drake, J.D. ; Zimmermann, P.H. ; Reine, M.B.

  • Author_Institution
    Honeywell Electro-Optics Division, Lexington, Massachusetts
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    707
  • Lastpage
    710
  • Keywords
    Capacitance measurement; Conductivity; Electrical resistance measurement; Heterojunctions; Mercury (metals); Ohmic contacts; Substrates; Temperature distribution; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190606
  • Filename
    1483731
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3556146