DocumentCode :
3556146
Title :
Electrical characterization of LPE n-p Hg0.8Cd0.2Te/CdTe heterojunctions
Author :
LoVecchio, P. ; Raghunath, T.R. ; Grimbergen, M.N. ; Rawe, R.L. ; Drake, J.D. ; Zimmermann, P.H. ; Reine, M.B.
Author_Institution :
Honeywell Electro-Optics Division, Lexington, Massachusetts
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
707
Lastpage :
710
Keywords :
Capacitance measurement; Conductivity; Electrical resistance measurement; Heterojunctions; Mercury (metals); Ohmic contacts; Substrates; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190606
Filename :
1483731
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3556146
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