• DocumentCode
    3556194
  • Title

    Hot carriers in small geometry CMOS

  • Author

    Akers, Lex A. ; Holly, Mary A. ; Lund, Clarence

  • Author_Institution
    Arizona State University, Tempe, AZ
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    80
  • Lastpage
    83
  • Abstract
    The effects of hot carriers on the electrical behavior of small geometry NMOS and PMOS devices are reported. Significant changes in device characteristics are shown to occur even at drain voltages scaled to 3 volts. Scaling the width is shown to cause enhanced hot carrier effects.
  • Keywords
    Electrical resistance measurement; Geometry; Hot carrier effects; Hot carriers; MOS devices; Plasma applications; Plasma devices; Stability; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190647
  • Filename
    1484418
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3556194