• DocumentCode
    3556315
  • Title

    InGaAs/GaAs, strained-layer superlattice (SLS), junction photodetectors, LED´s, injection laser´s, and FET´s for optoelectronic IC applications

  • Author

    Zipperian, T.E. ; Dawson, L.R. ; Barnes ; Wiczer, J.J. ; Osbourn, G.C.

  • Author_Institution
    Sandia National Laboratories, Albuquerque, NM
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    524
  • Lastpage
    527
  • Abstract
    A set of optoelectronic devices including p-n junction photodetectors, emitters (both an LED and a stripe-geometry, injection LASER), and a gain device have been fabricated from In0.2Ga0.8As/GaAs strained-layer superlattice (SLS) material. The photodetectors have demonstrated a peak external quantum efficiency at zero volts reverse bias(uncorrected for surface reflection) of 50% at 770nm and an optical absorption edge at 1050nm. Both the LED and injection LASER have peak, room temperature, emission wavelengths near 1020nm. The LASER exhibited cw, 77K operation at 976nm with a threshold current of 95mA, the first reported cw operation of an InGaAs/GaAs SLS LASER. Previously reported studies of prototype, double-gate, modulation-doped FETs (channel length = 2.5 µm) have demonstrated peak intrinsic transconductances of 120mS/mm at room temperature and 190mS/mm at 77K. These encouraging photodetector, LED, LASER, and FET results demonstrate that useful optical and electronic devices can be fabricated from mismatched materials and that the InGaAs/GaAs SLS system is an attractive candidate for integrated optoelectronic applications.
  • Keywords
    Application specific integrated circuits; FETs; Gallium arsenide; Indium gallium arsenide; Laser sintering; Light emitting diodes; Optical materials; Photodetectors; Superlattices; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190769
  • Filename
    1484540