DocumentCode :
3556345
Title :
Process considerations in restructurable VLSI for wafer-scale integration
Author :
Wyatt, P.W. ; Raffel, J.I. ; Chapman, G.H. ; Mathur, B. ; Burns, J.A. ; Herndon, T.O.
Author_Institution :
Massachusetts Institute of Technology, Lexington, MA
Volume :
30
fYear :
1984
fDate :
1984
Firstpage :
626
Lastpage :
629
Abstract :
Wafer-scale integration has recently been demonstrated using a technique called Restructurable VLSI. An array of logic cells embedded in programmable interconnect is fabricated on the wafer. All the parts are tested by wafer probing, and links are made or broken with a laser to wire the complete system. One such chip, a digital integrator 24 cm2in area with 25 MHz input data rate, has been successfully programmed. This paper will describe the RVLSI concept and discuss several aspects of wafer fabrication which are unusual in this technology.
Keywords :
Insulation life; Integrated circuit interconnections; Laser beam cutting; Optical device fabrication; Probes; Programmable logic arrays; Read-write memory; Testing; Very large scale integration; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1984 International
Type :
conf
DOI :
10.1109/IEDM.1984.190800
Filename :
1484571
Link To Document :
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