• DocumentCode
    355635
  • Title

    Modulation Z-scan technique in photorefractive crystals

  • Author

    Marquez Aguilar, P.A. ; Sanchez-Mondragon, Jose Javier ; Stepanov, S. ; Vyaloukh, V.

  • Author_Institution
    INAOE, Puebla, Mexico
  • fYear
    1996
  • fDate
    7-7 June 1996
  • Firstpage
    212
  • Lastpage
    213
  • Abstract
    Summary form only given. The Z-scan technique proved to be a quite simple method (it uses one laser beam only) for characterization of different optically nonlinear media. Recently this technique was also successively applied to photorefractive crystals (PRCs) Bi/sub 12/TiO/sub 20/ (BTO) under an external DC electric field. It was shown, however, that due to some point defects and inclusions that are typical for PRCs the standard Z-scan curves are characterized by a rather big spread of experimental points. Here we propose utilization of modulation version of this technique, which gives much better and more reproducible Z-scan curves in PRCs.
  • Keywords
    bismuth compounds; optical modulation; photorefractive materials; Bi/sub 12/TiO/sub 20/; DC electric field; inclusions; laser beam; modulation Z-scan technique; optically nonlinear medium; photorefractive crystal; point defects; Amplitude modulation; Crystals; Nonlinear optics; Optical modulation; Optical polarization; Optical refraction; Optimized production technology; Partial response channels; Photorefractive effect; Photorefractive materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-55752-444-0
  • Type

    conf

  • Filename
    865789