Title :
Microwave annealing for low temperature VLSI processing
Author :
Fukano, T. ; Ito, T. ; Ishikawa, H.
Author_Institution :
Fujitsu Laboratories, Ltd., Atsugi, Japan
Abstract :
The microwave annealing(MWA) has been found to effectively activate implanted dopants in silicon at a wafer temperature much lower than the melting point of aluminum (660 °C). The contact between aluminum and silicon can also be sintered producing a contact resistance as small as the value produced by the conventional furnace annealing. Characteristics of MOSFETs having a shallow junction fabricated with the MWA have shown possibility of low temperature processing for submicron VLSI devices.
Keywords :
Aluminum; Annealing; Dielectric losses; Electromagnetic heating; Furnaces; MOSFETs; Silicon; Surface resistance; Temperature; Very large scale integration;
Conference_Titel :
Electron Devices Meeting, 1985 International
DOI :
10.1109/IEDM.1985.190936