DocumentCode :
3556668
Title :
Numerical techniques lead to exact solution of berkeley bipolar model
Author :
Hart, A.D.
Volume :
32
fYear :
1986
fDate :
1986
Firstpage :
36
Lastpage :
39
Abstract :
An automated, process independent SPICE bipolar device modeling system has been developed. The system solves for a complete set of SPICE parameters that when simulated, provide the best mathematical fit to the actual measured performance of the transistor. Automatic computer decisions control all instrument measurements and model extraction procedures, providing consistency between device models, independent of the system operator. With a total measurement and extraction time of less than 30 minutes true statistical process performance may be evaluated.
Keywords :
Area measurement; Automatic control; Data mining; Equations; Instruments; Integrated circuit measurements; Performance evaluation; Probes; SPICE; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Type :
conf
DOI :
10.1109/IEDM.1986.191104
Filename :
1486362
Link To Document :
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