Title :
Excess photon detachment of negative hydrogen ions
Author :
Zhao, X.M. ; Bryant, H.C. ; Strauss, C.E.M. ; Funk, D.J. ; Stintz, A. ; Rislove, D. ; Kyrala ; Ingalls, W. ; Bililign, S.
Author_Institution :
Div. of Chem. Sci. & Technol., Los Alamos Nat. Lab., NM, USA
Abstract :
Summary form only given. Excess photon detachment (EPD) occurs when an electron is released from a negative ion with an energy corresponding to the absorption of more photons than the minimum number needed for detachment. We study the EPD of the simplest two-electron atom the negative hydrogen ion, with photons of energy 1.17 eV. Our time of flight (TOF) spectrum can be interpreted as an EPD spectrum with photoelectron peaks corresponding to single- and two-photon absorption.
Keywords :
electron detachment; high-speed optical techniques; hydrogen ions; photoelectron spectra; spectra; time of flight spectra; time resolved spectra; 1.17 eV; EPD spectrum; excess photon detachment; minimum number; negative hydrogen ion; negative hydrogen ions; negative ion; photoelectron peaks; single-photon absorption; time of flight spectrum; two-electron atom; two-photon absorption; Absorption; Chemical technology; Electron beams; Hydrogen; Ion beams; Laser beams; Optical pulses; Particle beam optics; Photonics; Polarization;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
