Excess photon detachment of negative hydrogen ions

Author

Zhao, X.M. ; Bryant, H.C. ; Strauss, C.E.M. ; Funk, D.J. ; Stintz, A. ; Rislove, D. ; Kyrala ; Ingalls, W. ; Bililign, S.

Author_Institution

Div. of Chem. Sci. & Technol., Los Alamos Nat. Lab., NM, USA

fYear

1996

fDate

7-7 June 1996

Firstpage

236

Lastpage

237

Abstract

Summary form only given. Excess photon detachment (EPD) occurs when an electron is released from a negative ion with an energy corresponding to the absorption of more photons than the minimum number needed for detachment. We study the EPD of the simplest two-electron atom the negative hydrogen ion, with photons of energy 1.17 eV. Our time of flight (TOF) spectrum can be interpreted as an EPD spectrum with photoelectron peaks corresponding to single- and two-photon absorption.

Keywords

electron detachment; high-speed optical techniques; hydrogen ions; photoelectron spectra; spectra; time of flight spectra; time resolved spectra; 1.17 eV; EPD spectrum; excess photon detachment; minimum number; negative hydrogen ion; negative hydrogen ions; negative ion; photoelectron peaks; single-photon absorption; time of flight spectrum; two-electron atom; two-photon absorption; Absorption; Chemical technology; Electron beams; Hydrogen; Ion beams; Laser beams; Optical pulses; Particle beam optics; Photonics; Polarization;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-444-0

Type

conf

Filename

865828