DocumentCode :
3556748
Title :
Half-micron photolithography using a KrF excimer laser stepper
Author :
Sasago, M. ; Endo, M. ; Hirai, Y. ; Ogawa, K. ; Ishihara, T.
Author_Institution :
Matsushita Electric Ind. Co., Ltd., Osaka, Japan
Volume :
32
fYear :
1986
fDate :
1986
Firstpage :
316
Lastpage :
319
Abstract :
This paper refers to the development of the KrF (248nm) excimer laser stepper system and related technology, both the resist and the alkaline water-soluble contrast enhancement materials, designed for use in combination with the excimer laser. A coherent-noise (speckle-free and high-speed image transmission have been successfully achieved by the high power. and narrow band width of the oscillation wavelength. The new positive resist has little absorption on the resist surface at around 248nm, which suggests high gamma value. The new water-soluble contrast-enhancement materials for the KrF excimer laser helps to attain the high contrast resolution of resist patterns. Both of these materials are very effective when used under the excimer laser system. This excimer laser lithography has been confirmed as an effective technology to fabricate 0.5 micron design rules VLSIs with hyperfine structure.
Keywords :
Adaptive optics; Apertures; High speed optical techniques; Laser modes; Lenses; Lithography; Optical design; Optical materials; Resists; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Type :
conf
DOI :
10.1109/IEDM.1986.191179
Filename :
1486437
Link To Document :
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