DocumentCode :
3556781
Title :
The current status of silicon-on-insulator technologies - a comparison
Author :
Partridge, S.L.
Author_Institution :
GEC Research Limited, Wembley, Middlesex
Volume :
32
fYear :
1986
fDate :
1986
Firstpage :
428
Lastpage :
430
Abstract :
This paper reviews the advantages of silicon-on-insulator (SOI) integrated circuits for a number of important application areas, placing particular emphasis on MOS technology. The most promising of the current contending techniques for substrate preparation, including oxygen ion implanted silicon (SIMOX), recrystallised polycrystalline silicon using the zone melting approach (ZMR), oxidised porous silicon, and epitaxial silicon-on-sapphire (SOS) are considered, and their current status in respect of materials properties, device and circuit performance are summarised.
Keywords :
Application specific integrated circuits; Dielectric substrates; Fabrication; Implants; Insulation; Integrated circuit technology; MOS devices; Oxidation; Semiconductor films; Silicon on insulator technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1986 International
Type :
conf
DOI :
10.1109/IEDM.1986.191210
Filename :
1486468
Link To Document :
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