Title :
Session 20 Modeling and simulation — Process and soft-errors
Author :
Neurether, A. ; Yokoyama, Kazuya
Author_Institution :
University of California
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1986 International
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IEDM.1986.191236
