Title :
Session 3 Solid state devices — Hot carrier effects
Author :
Hsu, Ethan ; Takeda, E.
Author_Institution :
Integrated Device Technology
Abstract :
Start of the above-titled section of the conference proceedings.
Conference_Titel :
Electron Devices Meeting, 1987 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1987.191341
