DocumentCode :
3557111
Title :
Session 20 Modeling and simulation — Hot electron, current crowding, and alpha-particle models
Author :
Arledge, L. ; Shur, M.
Author_Institution :
Texas Instruments, Inc.
fYear :
1987
fDate :
6-9 Dec. 1987
Firstpage :
493
Lastpage :
493
Abstract :
Start of the above-titled section of the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/IEDM.1987.191467
Filename :
1487425
Link To Document :
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