DocumentCode :
3557132
Title :
Observation of single electron trapping using scanning tunneling microscopy
Author :
Koch, R.H. ; Hamers, R.J.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume :
33
fYear :
1987
fDate :
1987
Firstpage :
566
Lastpage :
569
Keywords :
Current measurement; Density measurement; Electron traps; Rough surfaces; Scanning electron microscopy; Silicon; Surface resistance; Surface roughness; Surface topography; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Type :
conf
DOI :
10.1109/IEDM.1987.191489
Filename :
1487447
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3557132
بازگشت