DocumentCode :
3557147
Title :
High performance sample-and-hold implemented with GaAs/AlGaAs heterojunction bipolar transistor technology
Author :
Gorman, G.M. ; Camou, J.B. ; Oki, A.K. ; Oyama, B.K. ; Kim, M.E.
Author_Institution :
TRW Inc., Redondo Beach, CA
Volume :
33
fYear :
1987
fDate :
1987
Firstpage :
623
Lastpage :
626
Abstract :
A high-speed monolithic sample-and-hold (S/H) implemented with a GaAs/AlGaAs heterojunction bipolar transistor (HBT) IC technology is presented. This circuit is believed to be the first GaAs HBT S/H demonstrated. The S/H fabrication employs molecular-beam epitaxy and circuit integration with 3 µm emitter HBT, integrated Schottky diode, thin-film resistor, MIM capacitor, and double-level metal interconnect. S/H speed performance includes track bandwidth (-3 dB) of 1.8 GHz and sampled-mode analog bandwidth of 400 MHz at a sample rate of 800 Ms/s. The low frequency distortion (3rd harmonic) was at least -50 dBc for an input amplitude of 250 mV peak-to-peak. Preliminary test results indicate that the S/H has the potential for the accuracy required in 8-bit data conversion systems up to 400 Ms/s. Further development in processing is expected to improve both sampling rate and accuracy.
Keywords :
Bandwidth; Bipolar integrated circuits; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; High speed integrated circuits; Integrated circuit technology; Molecular beam epitaxial growth; Monolithic integrated circuits; Schottky diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Type :
conf
DOI :
10.1109/IEDM.1987.191504
Filename :
1487462
Link To Document :
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