DocumentCode :
3557148
Title :
Session 28 Modeling and simulation — MOS modeling
Author :
Pinto, M. ; Blakey, P.
Author_Institution :
AT&T Bell Laboratories
fYear :
1987
fDate :
6-9 Dec. 1987
Firstpage :
627
Lastpage :
627
Abstract :
Start of the above-titled section of the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/IEDM.1987.191505
Filename :
1487463
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3557148