DocumentCode :
3557179
Title :
New effects of trench isolated transistor using side-wall gates
Author :
Hieda, K. ; Horiguchi, F. ; Watanabe, H. ; Sunouchi, K. ; Inoue, I. ; Hamamoto, T.
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Volume :
33
fYear :
1987
fDate :
1987
Firstpage :
736
Lastpage :
739
Abstract :
In order to realize a high performance switching transistor, a new trench isolated transistor with side-wall gates has been developed. In this transistor with a triple-gate structure, the side-wall of the trench is used as an extra-channel region. The new effects of trench isolated transistor with a triple-gate structure have been described. The advantages of this transistor are excellent cutoff characteristics, a small substrate bias effect and high reliability characteristics. It is found that the side-wall gate along the channel edge plays an important role for increasing the gate controllability and for decreasing the concentration of the electric field at the drain.
Keywords :
Capacitors; Controllability; Electrodes; FCC; Isolation technology; Random access memory; Silicon; Thermal stresses; Threshold voltage; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1987 International
Type :
conf
DOI :
10.1109/IEDM.1987.191536
Filename :
1487494
Link To Document :
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