• DocumentCode
    3557179
  • Title

    New effects of trench isolated transistor using side-wall gates

  • Author

    Hieda, K. ; Horiguchi, F. ; Watanabe, H. ; Sunouchi, K. ; Inoue, I. ; Hamamoto, T.

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    736
  • Lastpage
    739
  • Abstract
    In order to realize a high performance switching transistor, a new trench isolated transistor with side-wall gates has been developed. In this transistor with a triple-gate structure, the side-wall of the trench is used as an extra-channel region. The new effects of trench isolated transistor with a triple-gate structure have been described. The advantages of this transistor are excellent cutoff characteristics, a small substrate bias effect and high reliability characteristics. It is found that the side-wall gate along the channel edge plays an important role for increasing the gate controllability and for decreasing the concentration of the electric field at the drain.
  • Keywords
    Capacitors; Controllability; Electrodes; FCC; Isolation technology; Random access memory; Silicon; Thermal stresses; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191536
  • Filename
    1487494