DocumentCode
3557208
Title
0.5 Micron BICMOS technology
Author
Momose, H. ; Cham, K.M. ; Drowley, C.I. ; Grinolds, H.R. ; Fu, H.S.
Author_Institution
Toshiba Corp., Kawasaki, Japan
Volume
33
fYear
1987
fDate
1987
Firstpage
838
Lastpage
840
Keywords
BiCMOS integrated circuits; CMOS technology; Capacitance; Cutoff frequency; Delay effects; Propagation delay; Research and development; Ring oscillators; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1987 International
Type
conf
DOI
10.1109/IEDM.1987.191563
Filename
1487521
Link To Document