Title :
1 THz bandwidth probing of devices and integrated circuits
Author :
Valdmanis, J.A. ; Nuss, M.C. ; Smith, P.R. ; Li, K.D. ; Pei, S.S.
Author_Institution :
AT&T Bell Laboratories, Murray Hill, NJ
Keywords :
Bandwidth; Circuits; Electric variables measurement; Electrooptic devices; Gallium arsenide; Laser modes; Optical pulse generation; Optical pulses; Sampling methods; Spatial resolution;
Conference_Titel :
Electron Devices Meeting, 1987 International
DOI :
10.1109/IEDM.1987.191570
