• DocumentCode
    3557216
  • Title

    An 8.6 um2 cell technology for a 35.5 mm2 megabit EPROM

  • Author

    Esquivel, A. ; Riemenschneider, B. ; Paterson, J. ; Tigelaar, H. ; Mitchell, A. ; Lahiry, R. ; Gill, M. ; Schreck, J. ; Dolby, D. ; Coffman, T. ; Lin, S. ; Shah, P.

  • Author_Institution
    Texas Instruments Inc., Dallas, TX
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    859
  • Lastpage
    861
  • Abstract
    A one megabit CMOS EPROM with a Floating gate Avalanche injection MOS (FAMOS) cell area of 8.6 µm2has been fabricated at a conservative design rule of 1.2µm This cell, to our knowledge, is the smallest reported EPROM cell. The process utilized an Advanced Contactless EPROM (ACE) technology combined with a High Voltage Enhanced Performance Implanted CMOS (HVEPIC) technology. The combined technique has produced fully functional one MBIT EPROMs with high density (bar size= 35.5 mm2of 55 Kmil2) and enhanced performance (130 ns access time) The HVEPIC/ACE technology features twin well CMOS, buried N+ bitlines, ultra-smooth polysilicon floating gates, oxide-nitride-oxide inter-polysilicon dielectric, double level polysilicon, single level metal, self-aligned TiSi2 and a post source/drain anneal processing temperature limited to 800°C.
  • Keywords
    CMOS technology; Dielectric losses; EPROM; History; Manufacturing; Nonvolatile memory; Stress measurement; Surfaces; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191571
  • Filename
    1487529