DocumentCode :
3557387
Title :
Over 1000V semi-superjunction MOSFET with ultra-low on-resistance below the Si-limit
Author :
Saito, Wataru ; Omura, Ichiro ; Aida, Satoshi ; Koduki, Shigeo ; Izumisawa, Masaru ; Yoshioka, Hironori ; Ogura, Tsuneo
Author_Institution :
Toshiba Corp. Semicond. Co., Kawasaki, Japan
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
27
Lastpage :
30
Abstract :
Si-MOSFETs with the breakdown voltage of over 1000 V were demonstrated, for the first time, realizing low on-resistance below the theoretical Si-limit. The fabricated MOSFETs have semi-superjunction (SemiSJ) structure, which is the combination of superjunction (SJ) structure and n-bottom assisted layer (BAL). The SemiSJ MOSFETs realize both the high breakdown voltage of 1100 and 1400 V and the low on-resistance of 54 and 163 mΩcm2, respectively. The fabrication process for the high voltage SemiSJ-MOSFET was completely equivalent to a 600-V class SJ-MOSFET process, which implies that a single optimized process for forming SJ structure for 600 V-class MOSFET can be used for a wide voltage range extending up to 1200 V MOSFET. These results show the possibility of new Si power-MOSFET with higher application voltage range.
Keywords :
elemental semiconductors; high-voltage engineering; p-n junctions; power MOSFET; silicon; 1100 V; 1400 V; 600 V; SemiSJ structure; breakdown voltage; elemental semiconductors; high voltage SemiSJ-MOSFET; high-voltage engineering; n-bottom assisted layer; p-n junctions; power MOSFET; semi-superjunction MOSFET; semi-superjunction structure; Breakdown voltage; Commercialization; Costs; Epitaxial growth; Fabrication; Inverters; MOSFET circuits; Power MOSFET; Power supplies; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
Type :
conf
DOI :
10.1109/ISPSD.2005.1487942
Filename :
1487942
Link To Document :
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