• DocumentCode
    3557445
  • Title

    High breakdown voltage GaN Schottky barrier diode employing floating metal rings on AlGaN/GaN hetero-junction

  • Author

    Lee, Seung-Chul ; Ha, Min-Woo ; Her, Jin-Cherl ; Kim, Soo-Seong ; Lim, Ji-Yong ; Seo, Kwang-Seok ; Han, Min-Koo

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    247
  • Lastpage
    250
  • Abstract
    We have reported a lateral GaN SBDs on AlGaN/GaN hetero-junction employing floating metal rings (FMRs) which exhibit a very high breakdown voltage, a low leakage current and a low on-state voltage. We have obtained a very high breakdown voltage of 930V without any additional process step. We have also optimized design parameters of FMR, such as the space between main junction and FMR and the number of rings. Our experimental results show that FMR which is rather simple may be suitable for lateral GaN SBD.
  • Keywords
    Schottky diodes; aluminium compounds; gallium compounds; leakage currents; semiconductor device breakdown; semiconductor heterojunctions; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN hetero-junction; FMR; GaN SBD; GaN Schottky barrier diode; breakdown voltage; floating metal rings; leakage current; Aluminum gallium nitride; Gallium nitride; Gold; Leakage current; Magnetic resonance; Schottky barriers; Schottky diodes; Semiconductor diodes; Semiconductor materials; Termination of employment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
  • Print_ISBN
    0-7803-8890-9
  • Type

    conf

  • DOI
    10.1109/ISPSD.2005.1487997
  • Filename
    1487997