Title :
Two-stage Hot Carrier Degradation of LDMOS Transistors.
Author :
Moens, P. ; Bauwens, F. ; Thomason, M.
Keywords :
Ambient intelligence; Birds; CMOS process; CMOS technology; Charge pumps; Degradation; Hot carriers; Semiconductor device modeling; Semiconductor optical amplifiers; Stress;
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
DOI :
10.1109/ISPSD.2005.1488016
