DocumentCode :
3557468
Title :
A Rugged LDMOS for LBC5 Technology
Author :
Hower, P. ; Lin, J. ; Pendharkar, S. ; Hu, B. ; Arch, J. ; Smith, J. ; Efland, T.
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
327
Lastpage :
330
Keywords :
Automotive engineering; BiCMOS integrated circuits; Charge carrier processes; Electrostatic discharge; Immune system; Instruments; Paper technology; Semiconductor optical amplifiers; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
Type :
conf
DOI :
10.1109/ISPSD.2005.1488017
Filename :
1488017
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3557468
