DocumentCode :
3557470
Title :
Optimization of 5V power devices based on CMOS for hot-carrier degradation
Author :
Nakamura, Kazutoshi ; Naka, Toshiyuki ; Matsushita, Kenichi ; Matsudai, Tomoko ; Yasuhara, Norio ; Endo, Koichi ; Suzuki, Fumito ; Nakagawa, Akio
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
335
Lastpage :
338
Keywords :
CMOS logic circuits; CMOS process; Costs; Degradation; Energy management; Hot carriers; Implants; Logic devices; Low voltage; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
Type :
conf
DOI :
10.1109/ISPSD.2005.1488019
Filename :
1488019
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3557470