Title :
Analysis of CuPc-based organic solar cell with high photovoltage
Author :
Aguilera, Ana ; Suresh Singh, R. ; Parthasarathy, Balaji ; Sampson, Karen E. ; Vallurupalli, S.C.C. ; Anthony, John E. ; Payne, Marcia M. ; Singh, Mjay P.
Author_Institution :
Electr. & Comput. Eng. Dept., Kentucky Univ., Lexington, KY, USA
Abstract :
Photovoltaic devices of the configuration ITO-PEDOT:PSS/CuPc/PTCBI/AI were investigated. A high open circuit voltage (V/sub OC/) of 1.125 V was obtained when the PTCBI layer was 7 nm thick. Value of V/sub OC/ was lower when silver, copper or gold electrode was used instead of aluminum. However, short-circuit current density (J/sub SC/) with these electrodes was much higher (4 mA/cm/sup 2/) than in the case of aluminum (0.12 mA/cm/sup 2/). These results could be understood in terms of a modified CuPc/AI Schottky diode model for the thin PTCBI case and a CuPc/PTCBI heterojunction model for the thick PTCBI case. Also, the formation of a thin, protective aluminum oxide layer under the aluminum electrode was postulated. For devices with silver, copper and gold electrodes, absence of this protective layer was thought to be the cause of the relatively lower V/sub CO/ and higher J/sub SC/.
Keywords :
Schottky diodes; aluminium; aluminium compounds; copper; copper compounds; current density; electrodes; gold; organometallic compounds; photovoltaic effects; protective coatings; short-circuit currents; silver; solar cells; 1.125 V; 7 nm; Ag; Al; Au; Cu; CuPc-based organic solar cell; CuPc/PTCBI heterojunction model; ITO; ITO-PEDOT:PSS/CuPc/PTCBI/AI configuration; InSnO; aluminum electrode; copper electrode; gold electrode; modified CuPc/AI Schottky diode model; open circuit voltage; photovoltage; photovoltaic devices; protective aluminum oxide layer formation; short-circuit current density; silver electrode; thin layer formation; Aluminum; Artificial intelligence; Copper; Electrodes; Gold; Photovoltaic cells; Photovoltaic systems; Protection; Silver; Solar power generation;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Conference_Location :
Lake Buena Vista, FL, USA
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488084