Title :
Growth and characterization of CdZnS thin film buffer layers by chemical bath deposition
Author :
Song, Jiyon ; Li, Sheng S. ; Yoon, S. ; Kim, W.K. ; Jihyun Kim ; Chen, J. ; Craciun, V. ; Anderson, T.J. ; Crisalle, O.D. ; Ren, Fan
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
In this paper we report the study of CdZnS thin films grown on the soda-lime glass (SLG) substrates by chemical bath deposition (CBD) process for buffer layer applications in CuGaSe2 (CGS) solar cells. Structural, surface morphology, optical, and electrical properties of as-deposited CdZnS films were investigated by XRD, SEM, spectrophotometer, and four probes resistivity measurements as a function of Zn-composition in the solution. The CdZnS films have hexagonal structures. The grain size of CdZnS films was found to increase with increasing Zn-content in the solution. The films with 30% of Zn in the solution showed a better than 80% transmittance for wavelengths longer than 600 nm and film thickness less than 50 nm. The values of energy band gaps obtained are 2.40, 2.55, and 2.70 eV for Zn-content of 0, 30, and 50%, respectively. The resistivity of CdZnS films was found to increase as the Zn content increases.
Keywords :
II-VI semiconductors; X-ray diffraction; buffer layers; cadmium compounds; electrical resistivity; energy gap; grain size; liquid phase deposition; scanning electron microscopy; semiconductor growth; semiconductor thin films; solar cells; surface morphology; ultraviolet spectra; visible spectra; zinc compounds; CdZnS; CdZnS thin film buffer layer; CuGaSe2 solar cells; SEM; XRD; Zn-composition; chemical bath deposition; electrical properties; energy band gap; film thickness; four probe resistivity measurements; grain size; hexagonal structure; optical properties; soda-lime glass substrates; spectrophotometer; structural properties; surface morphology; thin film buffer layer growth; transmittance; Buffer layers; Chemical processes; Glass; Optical films; Optical surface waves; Photovoltaic cells; Sputtering; Substrates; Surface morphology; Zinc;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488166
