Title :
The effect of Na on the defect structure in CuGaSe2 grown by molecular beam epitaxy
Author :
Yoon, Seokhyun ; Park, Chinho ; Komissarova, Tatyana ; Kim, Woo K. ; Anderson, Timothyt ; Noufi, Rommel ; Crisalle, Oscar D. ; Li, Sheng S. ; Jung, Jae H.
Author_Institution :
Dept. of Chem. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
Epitaxial CGS films were grown on (100) GaAs as a function of Cu/Ga ratio with and without Na dosing. All as-grown films showed good crystalline quality as evidenced by the FWHM value of the co-rocking curve for the (008) reflection being less than 300 arcsec for all films. In particular, the lowest value ever reported for CGS (80 arcsec) was measured for a Na-doped, Cu-rich CGS film. TEM analysis revealed pseudomorphic growth for all films with the strain believed to be released by the formation of twins in localized regions in the sample. From PL spectra at 10 K, donor-acceptor transitions were associated with VGa-VSe and CuGa-VSe defects as confirmed from their activation energies. A new defect level related to Na, which was tentatively assigned to NaGa, was observed for Cu-rich, Na-dosed CGS film and its activation energy was proposed as 20 meV above the valence band edge.
Keywords :
copper compounds; defect states; gallium compounds; impurity states; molecular beam epitaxial growth; photoluminescence; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; sodium; ternary semiconductors; transmission electron microscopy; twinning; valence bands; (008) reflection; 10 K; 20 meV; Cu/Ga ratio; CuGa-VSe defects; CuGaSe2 grow; CuGaSe2:Na; FWHM value; GaAs; Na dosing; Na-doped Cu-rich CGS film; PL spectra; TEM; VGa-VSe defects; activation energy; co-rocking curve; crystalline quality; defect level; defect structure; donor-acceptor transitions; epitaxial CGS films; molecular beam epitaxy; pseudomorphic growth; twin formation; valence band edge; Annealing; Atomic measurements; Chemical engineering; Energy states; Epitaxial growth; Gallium arsenide; Molecular beam epitaxial growth; Optical films; Substrates; Surface morphology;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488168