Title :
Thin-film photovoltaic radiation testing and modeling for a MEO orbit
Author :
Granata, J.E. ; Sahlstrom, T.D. ; Hausgen, P. ; Messenger, S.R. ; Walters, R.J. ; Lorentzen, J.R.
Author_Institution :
Aerosp. Corp., Albuquerque, NM, USA
Abstract :
A radiation test plan for thin-film photovoltaic technologies focused on a MEO flight experiment is outlined. The radiation response of thin film, triple junction amorphous Si solar cells, with and without a space coating, is presented. The degradation of the photovoltaic output under 2 MeV proton irradiation is measured and analyzed. Irradiations performed both at room temperature, in the dark, and at open circuit and at elevated temperature, under illumination, and under load were performed. The experimental data are presented and analyzed. These data will form the basis for an on-orbit prediction model as applied to a high-radiation MEO orbit.
Keywords :
aerospace instrumentation; aerospace testing; amorphous semiconductors; elemental semiconductors; environmental degradation; proton effects; semiconductor device testing; semiconductor heterojunctions; semiconductor thin films; silicon; solar cells; thin film devices; 2 MeV; Si; high-radiation MEO orbit; on-orbit prediction model; proton irradiation; space coating; thin-film photovoltaic radiation modeling; thin-film photovoltaic radiation testing; triple junction amorphous Si solar cells; Amorphous materials; Photovoltaic cells; Photovoltaic systems; Semiconductor thin films; Solar power generation; Space technology; Temperature; Testing; Thin film circuits; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488204