DocumentCode :
3557648
Title :
Analysis of EOL prediction methodology for triple-junction solar cells in actual radiation environment
Author :
Sumita, Taishi ; Imaizumi, Mitsuru ; Ohshima, Takeshi ; ltoh, H. ; Kuwajima, Saburou
Author_Institution :
Japan Aerosp. Exploration Agency, Ibaraki, Japan
fYear :
2005
fDate :
3-7 Jan. 2005
Firstpage :
667
Lastpage :
670
Abstract :
We investigated an optimal methodology for predicting end-of-life performance of triple-junction space solar cells using two major prediction methods (JPL and NRL produced). Neither prediction method could be applied to proton degradation after the current-limiting cell change, while electron degradation can be predicted using both methods even if the change occurred. The prediction methodology for an actual radiation environment was proposed based on the combinational irradiations by protons and electrons.
Keywords :
III-V semiconductors; electron beam effects; elemental semiconductors; environmental degradation; gallium arsenide; gallium compounds; germanium; indium compounds; life testing; proton effects; semiconductor heterojunctions; solar cells; EOL prediction methodology; InGaP-GaAs-Ge; actual radiation environment; combinational proton-electron irradiation; current-limiting cell change; electron degradation; end-of-life prediction methodology; proton degradation; triple-junction space solar cells; Acceleration; Degradation; Electrons; Laboratories; Performance analysis; Photovoltaic cells; Prediction methods; Protons; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488219
Filename :
1488219
Link To Document :
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