DocumentCode :
3557659
Title :
Mechanical Characteristics of FIB Deposited Carbon Nanowires Using an Electrostatic Actuated Nano Tensile Testing Device
Author :
Kiuchi, Mario ; Matsui, Shinji ; Isono, Yoshitada
Author_Institution :
Ritsumeikan Univ., Shiga
Volume :
16
Issue :
2
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
191
Lastpage :
201
Abstract :
This research is directed at the development of Electrostatic Actuated NAno Tensile testing devices (EANATs) for measuring mechanical properties of carbon nanowires, deposited by focused ion beam-assisted chemical vapor deposition (FIB-CVD) using phenanthrene gas. The EANATs were composed of the specimen part, actuator part and measurement part. 1000, 3000 and 5000 pairs of comb drive actuators were prepared within the actuator part for stretching the nanowires. The measurement part had a cantilever used as a lever motion amplification system for measuring tensile displacement of the nanowires. A theoretical resolution of 0.17 nm in tensile displacement was achieved using the amplification system and imaging analysis. The uniaxial tensile force was derived from the total spring constant of suspended beams built within the EANATs, with the theoretical resolutions ranging from 108 to 113 nN. This research was therefore successful in obtaining accurate load-displacement curves for carbon nanowires. The Young´s modulus observed for the nanowires provided the scatter in absolute values ranging from 42.6 to 80.7 GPa. The fracture stress and strain of the nanowires exhibited larger values of 4.3 GPa and 0.08 strain, respectively. Discussion of the deformation behaviors and failure mechanisms of the nanowires is made from FE-SEM observations of the nanowires before and after tensile failure
Keywords :
carbon nanotubes; elastic moduli measurement; electrostatic actuators; ion beam assisted deposition; micromechanical devices; nanowires; scanning electron microscopy; strain measurement; stress measurement; tensile testing; 0.17 nm; FE-SEM observations; FIB deposition; Young modulus; carbon nanowires; comb drive actuators; deformation behaviors; electrostatic actuator; failure mechanisms; focused ion beam-assisted chemical vapor deposition; fracture strain; fracture stress; imaging analysis; lever motion amplification system; load-displacement curves; mechanical characteristics; nanotensile testing device; phenanthrene gas; suspended beams; tensile displacement measurement; uniaxial tensile force; Actuators; Capacitive sensors; Displacement measurement; Electrostatic measurements; Focusing; Mechanical factors; Mechanical variables measurement; Motion measurement; Nanowires; Testing; Carbon nanowire; Young´s modulus; electrostatic comb-drive actuator; focused ion beam-assisted chemical vapor deposition (FIB-CVD); fracture stress and deformation behavior; tensile test;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
Conference_Location :
4/1/2007 12:00:00 AM
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2006.889663
Filename :
4147589
Link To Document :
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