DocumentCode :
3557818
Title :
Reliability of Components
Author :
Forrester, Jay W.
Volume :
5
Issue :
4
fYear :
1983
Firstpage :
399
Lastpage :
401
Abstract :
Because this issue of the Annals focuses on the SAGE system, the following excerpt from Christopher Evans´s 1975 interview with Jay W. Forrester is timely. Editor´s Note: Jay Forrester is one of the great pioneers of the computer business: director of Digital Computer Laboratory at MIT, builder of Whirlwind, inventor of core memory, and chief engineer for SAGE. His accomplishments are too numerous to mention, but this brief excerpt from an interview shows us something of his attitude toward design.
Keywords :
Circuit noise; Circuit testing; Computer architecture; Information processing; Power system reliability; Power system transients; Printed circuits; Reliability; Vacuum technology;
fLanguage :
English
Journal_Title :
Annals of the History of Computing
Publisher :
ieee
ISSN :
0164-1239
Type :
jour
DOI :
10.1109/MAHC.1983.10099
Filename :
4640774
Link To Document :
بازگشت