DocumentCode
3558148
Title
Gunn oscillations in thin GaAs epilayers and m.e.s.f.e.t.s
Author
Tsironis, C. ; Dekkers, J.J.M.
Author_Institution
Philips, Laboratoires d´´Electronique et de Physique Appliqu?ƒ?©e, Limeil-Br?ƒ?©vannes, France
Volume
127
Issue
5
fYear
1980
fDate
10/1/1980 12:00:00 AM
Firstpage
241
Lastpage
249
Abstract
Oscillations due to travelling Gunn domains have been observed in gated and ungated GaAs m.e.s.f.e.t.s (channels) made on v.p.e. and l.p.e. active layers. The doping was 1-2 à 1017 cm ¿3 and the thickness 0.1-0.2 ¿m. In channels with non-negative I/V slope the oscillators were possible only with pulsed bias and decayed 1¿3 ns after switching on the bias. In f.e.t.s the oscillations were self sustained, delivered approximately 60 ¿W r.f. power on 50 ¿ and their frequency in the range 16¿27 GHz was predicted, as in the channels, by the length of the drain to source gap, The domain formation is sensitive on the cross section of the epilayer and the microstructure of the ohmic contacts.
Keywords
Gunn effect; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor epitaxial layers; vapour phase epitaxial growth; GaAs epitaxial layers; Gunn oscillations; III-V semiconductor; LPE; MESFET; VPE; ohmic contacts;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
Conference_Location
10/1/1980 12:00:00 AM
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1980.0049
Filename
4642517
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