• DocumentCode
    3558148
  • Title

    Gunn oscillations in thin GaAs epilayers and m.e.s.f.e.t.s

  • Author

    Tsironis, C. ; Dekkers, J.J.M.

  • Author_Institution
    Philips, Laboratoires d´´Electronique et de Physique Appliqu?ƒ?©e, Limeil-Br?ƒ?©vannes, France
  • Volume
    127
  • Issue
    5
  • fYear
    1980
  • fDate
    10/1/1980 12:00:00 AM
  • Firstpage
    241
  • Lastpage
    249
  • Abstract
    Oscillations due to travelling Gunn domains have been observed in gated and ungated GaAs m.e.s.f.e.t.s (channels) made on v.p.e. and l.p.e. active layers. The doping was 1-2 × 1017 cm ¿3 and the thickness 0.1-0.2 ¿m. In channels with non-negative I/V slope the oscillators were possible only with pulsed bias and decayed 1¿3 ns after switching on the bias. In f.e.t.s the oscillations were self sustained, delivered approximately 60 ¿W r.f. power on 50 ¿ and their frequency in the range 16¿27 GHz was predicted, as in the channels, by the length of the drain to source gap, The domain formation is sensitive on the cross section of the epilayer and the microstructure of the ohmic contacts.
  • Keywords
    Gunn effect; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor epitaxial layers; vapour phase epitaxial growth; GaAs epitaxial layers; Gunn oscillations; III-V semiconductor; LPE; MESFET; VPE; ohmic contacts;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    10/1/1980 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1980.0049
  • Filename
    4642517