DocumentCode
3558180
Title
Calculated performance of monolithic hot-electron transistors
Author
Shannon, J.M.
Author_Institution
Philips, Research Laboratories, Redhill, UK
Volume
128
Issue
4
fYear
1981
fDate
8/1/1981 12:00:00 AM
Firstpage
134
Lastpage
140
Abstract
The properties of monolithic hot-electron transistors, together with structures required to obtain optimum performance, are described. It is calculated that, in principle, structures in Si and GaAs can be made with delay times ¿ 1 ps, while maintaining useful emitter and collector barriers capable of injecting and collecting electrons with energies well above the conduction band edge in the base. Assuming that the characteristic length for energy loss in these materials is similar, it is calculated that it should be possible to make transistors having FT and FMAX> 100 GHz with power delay products ¿ 1 fJ.
Keywords
III-V semiconductors; bipolar transistors; elemental semiconductors; gallium arsenide; hot carriers; silicon; GaAs; III-V semiconductor; Si; bipolar transistor; camel diode; conduction band edge; delay times; elemental semiconductor; monolithic hot-electron transistors;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
Conference_Location
8/1/1981 12:00:00 AM
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1981.0035
Filename
4642573
Link To Document