• DocumentCode
    3558180
  • Title

    Calculated performance of monolithic hot-electron transistors

  • Author

    Shannon, J.M.

  • Author_Institution
    Philips, Research Laboratories, Redhill, UK
  • Volume
    128
  • Issue
    4
  • fYear
    1981
  • fDate
    8/1/1981 12:00:00 AM
  • Firstpage
    134
  • Lastpage
    140
  • Abstract
    The properties of monolithic hot-electron transistors, together with structures required to obtain optimum performance, are described. It is calculated that, in principle, structures in Si and GaAs can be made with delay times ¿ 1 ps, while maintaining useful emitter and collector barriers capable of injecting and collecting electrons with energies well above the conduction band edge in the base. Assuming that the characteristic length for energy loss in these materials is similar, it is calculated that it should be possible to make transistors having FT and FMAX> 100 GHz with power delay products ¿ 1 fJ.
  • Keywords
    III-V semiconductors; bipolar transistors; elemental semiconductors; gallium arsenide; hot carriers; silicon; GaAs; III-V semiconductor; Si; bipolar transistor; camel diode; conduction band edge; delay times; elemental semiconductor; monolithic hot-electron transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    8/1/1981 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1981.0035
  • Filename
    4642573