Title :
Microwave detectors based on granular high-Tc thin films
Author :
Konopka, Janusz ; Sobolewski, Roman ; Jung, Grzegorz ; Kula, Witold ; Gierlowski, Piotr ; Konopka, Anna ; Lewandowski, Stanislaw J.
Author_Institution :
Inst. of Phys., Polish Acad. of Sci., Warsaw, Poland
fDate :
2/1/1990 12:00:00 AM
Abstract :
The detecting and mixing properties of microstrip superconducting Y-Ba-Cu-O and Bi-Ca-Sr-Cu-O thin-film structures deposited on various substrates have been investigated. The device performance was tested in the 22-, 55-, and 110-GHz frequency bands at temperatures ranging from 100 K to about 50 K. The sensitivity obtained at 110 GHz was comparable to that of crystalline detectors. Mixing experiments were performed in the 25-GHz frequency band and indicated that the detector response time is less than 40 ps. The intermediate frequency was varied from 50 MHz to 5 GHz without any decrease in the mixer output up to 3 GHz. Auxiliary emission measurements performed at 12 GHz and down to 4.2 K revealed that the detector low-temperature performance limit is associated with microwave radiation from clusters of intergrain weak links arranged in multiloop quantum interferometers
Keywords :
barium compounds; bismuth compounds; calcium compounds; high-temperature superconductors; microwave detectors; mixers (circuits); solid-state microwave devices; strip line components; strontium compounds; superconducting devices; superconducting thin films; yttrium compounds; 12 to 110 GHz; 4.2 to 100 K; 40 ps; 50 MHz to 5 GHz; Bi-Ca-Sr-Cu-O; EHF; MM-wave detector; SHF; Y-Ba-Cu-O; auxiliary emission measurements; detector response time; granular high-Tc thin films; high temperature superconductors; microstrip; microwave detectors; millimetre wave type; mixing properties; sensitivity; superconducting thin films; Detectors; Frequency; Granular superconductors; Microstrip; Sputtering; Substrates; Superconducting microwave devices; Superconducting thin films; Testing; Yttrium barium copper oxide;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Conference_Location :
2/1/1990 12:00:00 AM