• DocumentCode
    3558256
  • Title

    Comparison between two-dimensional short-channel MOSFET models

  • Author

    Kumar, Umesh

  • Author_Institution
    Indian Institute of Technology, Department of Electrical Engineering, New Dehli, India
  • Volume
    130
  • Issue
    1
  • fYear
    1983
  • fDate
    2/1/1983 12:00:00 AM
  • Firstpage
    37
  • Lastpage
    46
  • Abstract
    The miniaturisation of MOSFETs in MOS LSI to achieve high packing density, high speed, low cost and an ultra high performance has led to the development of very-short-channel MOS devices. This has given rise to several important small-geometry effects on MOSFET characteristics which cannot be described by the conventional one-dimensional analysis. A comprehensive review is presented of the various approaches aimed at two-dimensional modelling of these devices.
  • Keywords
    field effect integrated circuits; insulated gate field effect transistors; large scale integration; reviews; semiconductor device models; MOS LSI; review; short-channel MOSFET models; small-geometry effects; two-dimensional modelling;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    2/1/1983 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1983.0008
  • Filename
    4642675