DocumentCode :
3558285
Title :
Control of Schottky-diode-barrier height by Langmuir-Blodgett monolayers
Author :
Winter, C.S. ; Tredgold, R.H.
Author_Institution :
University of Lancaster, Physics Department, Lancaster, UK
Volume :
130
Issue :
5
fYear :
1983
fDate :
10/1/1983 12:00:00 AM
Firstpage :
256
Lastpage :
259
Abstract :
The authors show that it is possible to produce near-ideal Schottky diodes of the form GaP/polymeric monolayer/Au, by the Langmuir-Blodgett technique. By modifying poly(styrene/maleic anhydride) in various ways, monolayers with differing headgroup compositions but the same layer thickness were deposited. The resulting devices had barrier heights in the range 1.1¿1.5 eV depending on the headgroups present. A model based on an interfacial dipole layer, due to the headgroups reacting with the oxide layer on the semiconductor, is used to explain these results.
Keywords :
III-V semiconductors; Langmuir films; Schottky-barrier diodes; gallium compounds; semiconductor device models; GaP/polymeric monolayer/Au; III-V semiconductors; Langmuir-Blodgett monolayers; Schottky diodes; barrier height; headgroup compositions; interfacial dipole layer; layer thickness; poly(styrene/maleic anhydride); semiconductor device models;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
Conference_Location :
10/1/1983 12:00:00 AM
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1983.0045
Filename :
4642716
Link To Document :
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