Title :
Enhanced through-reflect-line characterization of two-port measuring systems using free-space capacitance calculation
Author :
Kasten, Jeffery S. ; Steer, Michael B. ; Pomerleau, Real
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fDate :
2/1/1990 12:00:00 AM
Abstract :
A through-reflect-line (TRL) calibration procedure is presented wherein the free-space capacitance and propagation factor of the line standard are used to determine the complex, frequency-dependent characteristic line impedance. The impedance is used in the conventional TRL, so the method is designated the ETRL (enhanced TRL) method. The method is applied to measurement of a microstrip via. The results show that the PCB via model used needs to be modified at frequencies above 2 GHz
Keywords :
calibration; capacitance; electric impedance; microwave measurement; network analysers; 2 GHz; RF frequencies; calibration procedure; complex line impedance; enhanced TRL; free-space capacitance calculation; frequency-dependent characteristic impedance; line standard; microstrip via; microwave frequencies; network analyser calibration; propagation factor; through-reflect-line characterization; two-port measuring systems; Automatic testing; Calibration; Capacitance; Dielectric constant; Fixtures; Frequency; Impedance measurement; Microstrip; Printed circuits; Scattering parameters;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Conference_Location :
2/1/1990 12:00:00 AM
