DocumentCode :
3558546
Title :
Enhanced GaAs MESFET CAD model for a wide range of temperatures
Author :
Ytterdal, Trond ; Moon, Byung-Jong ; Fjeldly, Tor A. ; Shur, Michael S.
Author_Institution :
Dept. of Phys. Electron., Norwegian Inst. of Technol., Trondheim, Norway
Volume :
42
Issue :
10
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
1724
Lastpage :
1734
Abstract :
We describe a new and enhanced GaAs MESFET model suitable for implementation in computer aided design (CAD) software packages such as, for example, SPICE. The model accurately reproduces both above-threshold and subthreshold characteristics of GaAs MESFET´s in a wide temperature range, from 77 K to 350°C. The current-voltage characteristics are described by a single continuous, analytical expression for all regimes of operation. The physics-based model includes effects such as velocity saturation in the channel, drain induced barrier lowering, finite output conductance in saturation, bias dependent series source and drain resistances, effects of bulk charge, bias dependent average low-field mobility, frequency dependent output conductance, backgating and sidegating, and temperature dependent model parameters. The output resistance and the transconductance are also accurately reproduced, making the model suitable for analog CAD.
Keywords :
CAD; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; 77 to 350 K; GaAs; GaAs MESFET model; SPICE; analog CAD; backgating; barrier lowering; bulk charge; computer aided design; current-voltage characteristics; low-field mobility; output conductance; sidegating; software packages; temperature dependence; transconductance; velocity saturation; Current-voltage characteristics; Design automation; Frequency dependence; Gallium arsenide; MESFETs; SPICE; Software design; Software packages; Temperature dependence; Temperature distribution;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
Conference_Location :
10/1/1995 12:00:00 AM
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.464426
Filename :
464426
Link To Document :
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