Title :
Comments on "A method to predict an average activation energy for subassemblies" [with reply]
Author :
Fieselman, C.D. ; Seager, J.D.
Abstract :
The commenter claims that there are certain limitations and inaccuracies in the above-named work (see ibid., vol.37, p.458-61, Dec. 1988) by J.D. Seager and C.D. Fieselman. In replying, Seager and Fieselman state that there are no inaccuracies in their work.<>
Keywords :
failure analysis; reliability; acceleration factor; average activation energy; reliability; subassemblies; Acceleration; Circuit testing; Equations; Humidity; Integrated circuit modeling; Integrated circuit testing; Life estimation; Power dissipation; Temperature; Thermal stresses;
Journal_Title :
Reliability, IEEE Transactions on
