Title :
Characterization of inverse-Gaussian and gamma distributions through their length-biased distributions
Author :
Khattree, Ravindra
Author_Institution :
North Dakota State Univ., Fargo, ND, USA
fDate :
12/1/1989 12:00:00 AM
Abstract :
For the case where Y is a length-biased random variable corresponding to a random variable X having an inverse-Gaussian or gamma distribution, it is shown that Y can be written as a linear combination of X and a chi-square random variable and, conversely, X can be characterized through this relationship. Finally, the Wald distribution is characterized
Keywords :
probability; reliability theory; statistical analysis; Wald distribution; chi-square random variable; gamma distribution; inverse Gaussian distribution; length-biased distributions; length-biased random variable; reliability; Gaussian distribution; Logistics; Probability distribution; Random variables; Reliability theory; Sampling methods; Shape;
Journal_Title :
Reliability, IEEE Transactions on
Conference_Location :
12/1/1989 12:00:00 AM