DocumentCode :
3558804
Title :
Characterization of inverse-Gaussian and gamma distributions through their length-biased distributions
Author :
Khattree, Ravindra
Author_Institution :
North Dakota State Univ., Fargo, ND, USA
Volume :
38
Issue :
5
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
610
Lastpage :
611
Abstract :
For the case where Y is a length-biased random variable corresponding to a random variable X having an inverse-Gaussian or gamma distribution, it is shown that Y can be written as a linear combination of X and a chi-square random variable and, conversely, X can be characterized through this relationship. Finally, the Wald distribution is characterized
Keywords :
probability; reliability theory; statistical analysis; Wald distribution; chi-square random variable; gamma distribution; inverse Gaussian distribution; length-biased distributions; length-biased random variable; reliability; Gaussian distribution; Logistics; Probability distribution; Random variables; Reliability theory; Sampling methods; Shape;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
Conference_Location :
12/1/1989 12:00:00 AM
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.46490
Filename :
46490
Link To Document :
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