DocumentCode
3558849
Title
Sensitivity-Stabilized Fiber-Mounted Electrooptic Probe for Electric Field Mapping
Author
Togo, Hiroyoshi ; Kukutsu, Naoya ; Shimizu, Naofumi ; Nagatsuma, AndTadao
Author_Institution
NTT Microsyst. Integration Labs., NTT Corp., Atsugi
Volume
26
Issue
15
fYear
2008
Firstpage
2700
Lastpage
2705
Abstract
We have developed a sensitivity-stabilized fiber-mounted electrooptic (EO) probe for electric field mapping. In this probe, a polarization-rotated reflection method is used to cancel out the phase difference between the lights transmitted on the fast and slow axes of a polarized maintaining fiber (PMF) in a round trip since a Faraday rotator (FR) on the tip of the PMF rotates the polarization plane of the transmitted light orthogonally. Consequently, the sensitivity of the EO probe is stable against PMF bending and changes in temperature. The sensitivity degradation caused by PMF bending with a radius larger than 4 mm is less than 0.5 dB. The sensitivity fluctuation caused by a temperature change of 50degC to 100degC is suppressed to less than 1 dB. Since the PMF connecting the EO probe to the polarization control module is 5-m long, we can avoid any disturbance from the region around the probe tip. We demonstrate precise near-field measurements for a dipole antenna in a 20 cm x 10 cm scanning area. This result means that the EO probe can be used for calibrating antennas fixed in practical fields.
Keywords
electric field measurement; electro-optical devices; optical fibres; optical sensors; Faraday rotator; electric field mapping; fiber-mounted electrooptic probe; polarization-rotated reflection method; polarized maintaining fiber; temperature 100 degC; Antenna measurements; Area measurement; Degradation; Dipole antennas; Fluctuations; Joining processes; Optical fiber polarization; Optical reflection; Probes; Temperature sensors; Electric field measurement; Faraday rotator; electrooptic effect; polarization–rotation reflection method;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2008.927612
Filename
4652310
Link To Document